computed+tomography+(ct) Results | Available Intellectual Property | Rensselaer Polytechnic Institute

Search Results - computed+tomography+(ct)

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Rapid Filtration Methods for Dual-energy X-ray CT
RPI ID: 2016-056-401, 2016-056-601, 2016-056-602, 2016-056-603Innovation Summary:This portfolio features a suite of advanced filtration technologies developed to enhance the performance of dual-energy X-ray computed tomography (DECT) systems. These innovations address key limitations in spectral separation, motion artifact reduction, and computational...
Published: 7/21/2025   |   Updated: 7/7/2025   |   Inventor(s): Wenxiang Cong, Yan Xi, Ge Wang
Keywords(s): Biomedical Engineering, computed tomography (CT), Diagnosis, Dual-energy X-ray CT, dual-layer x-ray detection, dual-source scanning, Imaging, kVp-switching, Measurement, Safety
Category(s): Biotechnology and the Life Sciences
Deep learning for metal artifact reduction in computed tomography images
RPI ID: 2018-008-401, 2018-008-601Innovation Summary:This invention from Rensselaer Polytechnic Institute introduces a deep learning-based framework for reducing metal artifacts in computed tomography (CT) images. The system leverages a neural network trained on paired CT datasets—with and without metal artifacts—to reconstruct high-fidelity images...
Published: 7/21/2025   |   Updated: 7/3/2025   |   Inventor(s): Ge Wang, Lars Gjesteby, Qingsong Yang, Hongming Shan
Keywords(s): computed tomography (CT), deep learning, machine-learning, metal artifact reduction
Category(s): Biotechnology and the Life Sciences