Geometrical Errors Correction in Truncated Scans via Locally Linear Embedding with A Phase Correlation Metric | Available Intellectual Property | Rensselaer Polytechnic Institute

Geometrical Errors Correction in Truncated Scans via Locally Linear Embedding with A Phase Correlation Metric

RPI ID:
2023-087-301

Innovation Summary:
This technology applies locally linear embedding (LLE) techniques to correct motion artifacts in computed tomography (CT) imaging. It models patient movement during scans and reconstructs accurate images by embedding motion data into the reconstruction algorithm. The system improves image clarity and diagnostic reliability. It is particularly useful in dynamic or uncooperative patient scenarios.

Challenges / Opportunities:
Motion artifacts degrade CT image quality and complicate diagnosis. This invention addresses the need for real-time, data-driven correction methods. It presents opportunities for improved imaging in pediatric, trauma, and emergency care. The approach also supports integration into existing CT platforms with minimal hardware changes.

Key Benefits / Advantages:
✔ Reduces motion artifacts in CT imaging
✔ Enhances diagnostic accuracy
✔ Compatible with existing CT systems
✔ Data-driven correction using LLE

Applications:
• Medical imaging and diagnostics

Keywords:
Computed tomography, motion correction, locally linear embedding, medical imaging, artifact reduction

Intellectual Property:
WO2025010333A2 (Application PCT/US2024/036703), Published July 3, 2024

Patent Information: