CT metal artifact reduction (MAR) using high energy x-rays | Available Intellectual Property | Rensselaer Polytechnic Institute

CT metal artifact reduction (MAR) using high energy x-rays

RPI ID: 2015-022-201

Innovation Summary:
This technology provides a computational imaging solution for reducing metal artifacts in CT scans using dual-energy datasets. It captures X-ray projection data at two different energy levels and uses a pseudo-dataset to adjust for variations in attenuation caused by metal. The method identifies metal trace regions and transforms projection data to produce cleaner, artifact-free images. This enhances diagnostic accuracy when imaging patients with implants, surgical clips, or prosthetics. The system improves visual clarity while preserving anatomical details in affected areas. By leveraging dual-energy inputs, it can account for both soft tissue and dense materials without hardware modification.

Challenges / Opportunities:
Metal artifacts in CT scans are a major limitation in diagnostic imaging, obscuring tissues and leading to misinterpretation. Conventional methods either remove useful data or require expensive hardware upgrades. This algorithmic solution works with existing CT machines and improves image quality through post-processing. It supports safer diagnoses, reduces need for repeat imaging, and enhances patient outcomes.

Key Benefits / Advantages:
✔ Artifact reduction from metal implants
✔ Dual-energy reconstruction
✔ Enhances diagnostic imaging quality

Applications:
• Medical imaging for patients with implants
• Orthopedic diagnostics
• Image-guided surgery and therapy

Keywords:
#CTimaging #metalartifactreduction #dualdataset #diagnosticaccuracy

Intellectual Property:
US Issued Patent US 9,655,580 B2
Patent Information:
Inventors:
Bruno De Man
Yannon Jin
Ge Wang
Yan Xi
Keywords:
Biomedical Engineering
Imaging
For Information, Contact:
Natasha Sanford
Licensing Associate
Rensselaer Polytechnic Institute
sanfon@rpi.edu