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X-ray Phase-contrast and Dark-field Information Extraction with Electric Fringe Scanning and/or Active Pixel Processing
RPI ID: 2016-003-401Innovation Summary:This invention introduces a next-generation X-ray imaging system that extracts both phase-contrast and dark-field data without requiring mechanical grating translation. By integrating the analyzer grating (G2) functionality directly into the detector and controlling it electrically, the system eliminates the need...
Published: 7/21/2025
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Updated: 7/7/2025
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Inventor(s): Shuo Pang, Zaifeng Shi, Wenxiang Cong, Ge Wang
Keywords(s): image reconstruction, x-ray dark-field imaging, X-ray grating imaging, x-ray phase imaging
Category(s): Biotechnology and the Life Sciences
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