RPI ID: 2016-003-401

Innovation Summary:
This invention introduces a next-generation X-ray imaging system that extracts both phase-contrast and dark-field data without requiring mechanical grating translation. By integrating the analyzer grating (G2) functionality directly into the detector and controlling it electrically, the system eliminates the need for precise physical movement. The technique leverages electric fringe scanning and active pixel processing to record moiré fringe shifts as voltage is modulated. These fringe patterns provide insight into phase-shift and scattering behavior within a sample, enabling high-contrast imaging of soft tissues and microstructures. This compact, high-resolution imaging approach reduces acquisition time and radiation dose, while improving diagnostic quality. It is adaptable to a range of biomedical and industrial applications where soft matter visualization is important.

Challenges / Opportunities:
Grating-based X-ray imaging systems traditionally require mechanical phase stepping, which slows down imaging and adds alignment complexity. Such systems are also expensive and mechanically fragile, making them unsuitable for clinical environments. This invention simplifies the hardware by eliminating moving gratings, enabling real-time and portable implementations. It opens opportunities for accessible phase-contrast imaging in clinical diagnostics, materials testing, and compact scanners for point-of-care use.

Key Benefits / Advantages:
✔ Eliminates moving gratings
✔ Enables fast, low-dose phase-contrast imaging
✔ Integrates grating function into detector electronics

Applications:
• Soft tissue biomedical imaging
• Non-destructive testing in composites
• Compact portable imaging systems

Keywords:
#xrayphasecontrast #darkfieldimaging #activepixel #electronicfringes

Intellectual Property:
US Issued Patent 10,729,397 B2