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Terahertz Plasmonics for Testing Very Large-Scale Integrated Circuits under Bias
RPI ID: 2016-011-201, 2016-011-602Innovation Summary:This technology offers a novel approach to non-destructive testing of VLSI circuits using terahertz (THz) and sub-THz radiation. The system directs THz waves onto a chip and detects signal variations at output pins, revealing connectivity integrity. This allows chip function and health to be verified...
Published: 7/21/2025
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Updated: 7/7/2025
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Inventor(s): Michael Shur, John Suarez, Sergey Rudin, Greg Rupper, Meredith Reed
Keywords(s): Terahertz Technology, Testing VLSI
Category(s): Computational Science and Engineering
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