david+rundle Results | Available Intellectual Property | Rensselaer Polytechnic Institute

Search Results - david+rundle

2 Results Sort By:
X-ray Photon-Counting Data Correction through Deep Learning
RPI ID: 2020-047-201 Innovation Summary: A deep learning-based method is introduced to correct distortions in photon-counting X-ray imaging data. The system compensates for spectral distortions and pile-up effects that degrade image quality in photon-counting detectors. Neural networks are trained to reconstruct corrected images from raw detector outputs,...
Published: 3/10/2026   |   Updated: 3/10/2026   |   Inventor(s): Mengzhou Li, David Rundle, Ge Wang
Keywords(s): charge splitting, deep learning, PCD data correction, PCDs, photon-counting detector, pulse pile-up
Category(s): Biotechnology and the Life Sciences
A Deep Neural Network based Corrector for Pulse Pileup Effect of Photon Counting Detectors
RPI ID: 2018-020-401 / 2018-020-601Innovation Summary:This invention introduces a neural network-based corrector for photon-counting computed tomography (PCCT) systems. Designed to address spectral distortions and detector non-linearities, the system processes raw photon data to generate corrected images with enhanced spectral fidelity and quantitative...
Published: 7/21/2025   |   Updated: 7/3/2025   |   Inventor(s): Ge Wang, Ruibin Feng, David Rundle
Keywords(s): deep learning, machine-learning, photon-counting Data
Category(s): Computational Science and Engineering