RPI ID: 2018-011-401 / 2018-011-601
Innovation Summary:
This invention introduces a novel detection scheme for X-ray small angle scattering (SAXS) that enhances sensitivity and spatial resolution for nanoscale structural analysis. The system employs a specialized detector configuration and signal processing method to capture scattered X-rays with improved angular precision. By optimizing both geometry and detection algorithms, the technology enables more accurate characterization of soft matter, biological samples, and nanomaterials. It is particularly suited for high-throughput, non-destructive analysis.
Challenges / Opportunities:
Conventional SAXS systems often suffer from limited resolution, low signal-to-noise ratios, and complex alignment requirements. These limitations restrict their utility in real-time or high-precision environments. This invention addresses those challenges by offering a more robust and sensitive detection architecture, opening new opportunities in materials science, biomedical research, and pharmaceutical development.
Key Benefits / Advantages:
✔ Enhanced angular resolution and detection sensitivity
✔ Improved signal-to-noise ratio for weakly scattering samples
✔ Compatible with existing SAXS instrumentation
✔ Enables high-throughput and real-time analysis
✔ Non-destructive and label-free characterization
Applications:
• Structural biology and protein folding studies
• Nanomaterials and polymer research
• Pharmaceutical formulation and quality control
• Soft matter and colloidal systems
• Advanced materials characterization
Keywords:
#SAXS #nanoscaleimaging #structuralanalysis #detectorinnovation #materialscharacterization
Intellectual Property:
US Issued Patents 11,592,406 B2 and 11,313,814 B2
