RPI ID: 2015-056-401

Innovation Summary:
This invention presents a novel image reconstruction technique for computed tomography (CT) using current-integrating data and dual-energy imaging. Unlike standard CT that assumes ideal line-integral models, this method uses a realistic polychromatic model for X-ray interactions. An optimization framework decomposes sinogram data into physical basis components, increasing reconstruction accuracy. The technique allows for low-dose, region-specific imaging—ideal for visualizing implants or targeted therapies. It supports both analytical and numerical methods to reduce computational load while improving spatial and spectral resolution. This approach enhances diagnostic clarity, especially in patients with metal implants or targeted treatment zones.

Challenges / Opportunities:
Conventional CT systems suffer from beam hardening and scatter artifacts due to physical model mismatches. These issues lead to inaccurate images and excessive radiation doses. This method reduces reliance on full-body exposure by focusing on specific regions of interest. It is particularly suited for personalized medicine and implant monitoring. The invention paves the way for more efficient CT workflows with reduced computational and biological costs.

Key Benefits / Advantages:
✔ Supports dual-energy and spectral CT
✔ Accurate model-based image decomposition
✔ Enables low-dose localized scanning

Applications:
• Orthopedic imaging with implants
• Targeted radiotherapy evaluation
• Spectral CT for tissue characterization

Keywords:
#CTimaging #spectralCT #lowdose #dualenergyCT

Intellectual Property:
US Issued Patent US 11,423,591 B2