Plasma-Induced-THz-Spectroscopy
RPI ID: 2006-039-201 Innovation Summary: This invention describes a method for generating terahertz radiation using plasma induced by electromagnetic radiation. It enables remote sensing of materials through phase transformation and plasma emission. The system can detect chemical and structural properties from a distance. It is ideal for security, environmental monitoring, and industrial inspection. Challenge/Opportunity: Remote sensing technologies often struggle with resolution and material specificity. This invention provides a non-contact method for high-resolution, material-specific detection. It addresses the need for safer and more accurate sensing in hazardous or inaccessible environments. The opportunity lies in its application to defense, safety, and quality control. Key Benefits and Advantages: ✔ Non-contact sensing ✔ High-resolution terahertz imaging ✔ Material-specific detection ✔ Operates in harsh environments Applications: • Security screening • Environmental monitoring • Industrial inspection • Scientific research Keywords: #Terahertz radiation #plasma emission #remote sensing #spectroscopy #non-contact detection Intellectual Property: US Issued Patent 7652253
Patent Information:
Title |
App Type |
Country |
Serial No. |
Patent No. |
File Date |
Issued Date |
Expire Date |
Patent Status |
|
|
|
|