Adaptive Scanning Optical Microscope (ASOM) | Available Intellectual Property | Rensselaer Polytechnic Institute

Adaptive Scanning Optical Microscope (ASOM)

RPI ID: 2005-060-403

Innovation Summary:
This invention introduces an adaptive-scanning optical microscope that dynamically adjusts scanning parameters in response to the sample being observed. It integrates a steering mirror and adaptive optics to correct for field-dependent aberrations in real time. This configuration significantly enhances image quality across a wide field of view. The system is particularly advantageous for biological imaging and micro-assembly applications.

Challenges / Opportunities:
Traditional microscopes often face a trade-off between resolution and field of view, limiting their effectiveness in large-area, high-detail imaging. This technology addresses that limitation by actively adapting the optical path during scanning. It enables consistent high-resolution imaging across expansive sample areas. The innovation opens new possibilities in biomedical research, diagnostics, and precision manufacturing.

Key Benefits / Advantages:
✔ High-resolution imaging over wide fields
✔ Real-time aberration correction
✔ Enhanced image quality across the field of view
✔ Suitable for dynamic or live samples
✔ Applicable to both biological and industrial settings

Applications:
• Biological imaging
• Micro-assembly
• Medical diagnostics
• Materials inspection

Keywords:
#AdaptiveOptics #ScanningMicroscope #HighResolutionImaging #OpticalCorrection #Microscopy

Intellectual Property:
US Issued Patent 7742213
Patent Information:
Inventors:
Yves Bellouard
Benjamin Potsaid
John Wen
Keywords:
Nanomaterials
Thin Film
For Information, Contact:
Natasha Sanford
Licensing Associate
Rensselaer Polytechnic Institute
sanfon@rpi.edu