Broadband Terahertz Wave Detection with GaSe Crystals | Available Intellectual Property | Rensselaer Polytechnic Institute

Broadband Terahertz Wave Detection with GaSe Crystals

RPI ID: 2004-068-201

Innovation Summary:
This invention introduces a broadband terahertz (THz) detector utilizing gallium selenide (GaSe) crystals. The system is designed to measure the intensity of THz frequency pulses with high sensitivity and broad spectral coverage. It employs a coherent optical probe beam aligned at a phase-matching angle to the GaSe substrate, enabling efficient electro-optic sampling. The setup includes coupling optics, a polarization detector, and signal processing components to extract THz pulse information. This approach allows for real-time, non-contact detection of THz radiation, which is critical for applications in spectroscopy, imaging, and communications.

Challenges / Opportunities:
Traditional THz detectors often suffer from limited bandwidth, low sensitivity, or complex cooling requirements. This invention addresses those limitations by leveraging the nonlinear optical properties of GaSe crystals, which offer broad bandwidth and room-temperature operation. The opportunity lies in advancing THz technologies for security screening, biomedical diagnostics, and high-speed wireless communication, where fast and accurate THz detection is essential.

Key Benefits / Advantages:
✔ Broadband detection of THz pulses
✔ High sensitivity using electro-optic sampling
✔ Operates at room temperature
✔ Suitable for real-time, non-invasive applications

Applications:
• Terahertz spectroscopy and imaging
• Non-destructive testing and quality control
• Biomedical diagnostics and tissue analysis
• High-speed wireless communication systems

Keywords:
#terahertz #GaSecrystals #broadbanddetection #electrooptics #THztechnology

Intellectual Property:
US Issued Patent US 7,242,010
Patent Information:
Inventors:
Kai Liu
Jingzhou Xu
Xi-Cheng Zhang
Keywords:
For Information, Contact:
Natasha Sanford
Licensing Associate
Rensselaer Polytechnic Institute
sanfon@rpi.edu