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Patch-Based Denoising Diffusion Probabilistic Model for Sparse-View CT Reconstruction
RPI ID:
2023-022-301, 2023-022-401
Innovation Summary:
This technology provides a full tomographic data estimation system that reconstructs complete tomographic datasets from sparse inputs. It includes preprocessing circuitry that divides sparse data into N subsets, parallel estimation circuitry that reconstructs each subset using a trained score model,...
Published: 3/10/2026
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Updated: 3/10/2026
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Inventor(s): Wenjun Xia, Wenxiang Cong, Ge Wang
Keywords(s): high-resolution cone-beam CT, patch-based denoising diffusion probabilistic model, Sparse-view CT reconstruction
Category(s): Computational Science and Engineering
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